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Experiment with SPM and XRF: Data Collection and Analysis, Study notes of Chemistry

This document details a two-day experiment using scanning probe microscopy (spm) and x-ray fluorescence (xrf) for material analysis. Objectives, data obtained, and conclusions from the experiment. Spm scans a sample's surface to create images, while xrf measures the emission of fluorescent x-rays for elemental analysis. The experiment involved calibrating the spm and analyzing a meteorite sample using both techniques.

Typology: Study notes

2011/2012

Uploaded on 12/23/2012

baga.baber
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Download Experiment with SPM and XRF: Data Collection and Analysis and more Study notes Chemistry in PDF only on Docsity! Experiment #7: SPM & XRF Introduction: SPM stands for scanning probe microscopy. It scans an image using a physical probe on the sample’s surface. This action forms an image of what the sample surface looks like. The read outs are two dimensional grids of data points colored-in by computer programming. XRF stands for X-ray Fluorescence. This instrument measures emission of fluorescent X-rays from material that has been excited by X-rays. This is typically done for elemental analysis. A typical read out consists of digital counts processed for analytical data. Day One Objective: Utilized time by becoming familiar with instrumentation on SPM and XRF. XRF was standardized and a meteorite sample was then analyzed. Qualitative results with a peak list were obtained. SPM was explored and initiated, but no images were completed or ran. Data: • Peak list is attached in notebook for both calibration and meteorite sample. Day Two Objective: Laser calibration was completed on SPM and samples of 4.75 µm and 1 µm were completed. Data: • Images obtained from 4.75 µm: Docsity.com Tistogr, aur 708mm eight: 231. nm. 302. nm = bo 2° S & 50 130 250 om Images obtained from 1 um: (6.23 OCIS pm y 09719 pm 32:00 um an sit rm a A a A Docsity.com
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