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Test 1 Practice Problems on Circuits I - Spring 2008 | EE 2120, Exams of Microelectronic Circuits

Louisiana State University (LSU) - System Office Microelectronic Circuits

Prof. Jorge Aravena

Material Type: Exam; Professor: Aravena; Class: CIRCUITS I; Subject: Electrical Engineering; University: Louisiana State University; Term: Spring 2008;

Typology: Exams

2009/2010

Uploaded on 02/15/2010

wbeal1 🇺🇸

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Download Test 1 Practice Problems on Circuits I - Spring 2008 | EE 2120 and more Exams Microelectronic Circuits in PDF only on Docsity! EE2120 TEST No. 1 February 12, 2008 NAME(please print) INSTRUCTIONS Failure to follow these instructions may result in your work NOT being accepted for credit. • DO NOT OPEN THIS TEST UNTIL THE INSTRUCTOR TELLS YOU • All work is individual. Concentrate on your own paper at all times • STOP WORKING AS SOON AS THE INSTRUCTOR TELLS YOU • When instructed, walk to the front and leave your work on the instruc- tor’s desk • If you finish ahead of time, walk to the front and leave your work on the instructor’s desk • SHOW ALL YOUR WORK Prepared by Dr. Jorge L. Aravena. Last revised on February 12, 2008 2 1. (25pts) For the circuit in the figure it is known that component 1 absorbs 48W . Determine (a) (10pts) The voltage Vab (b) (10pts) The current I . (c) (5pts) The power absorbed or supplied by component 2.

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Test 1 Practice Problems on Circuits I - Spring 2008 | EE 2120, Exams of Microelectronic Circuits

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